Caracterización química y estructural avanzada de desperdicios de memoria RAM: Un enfoque hacia la reciclabilidad y seguridad ambiental

Luis Gabriel  Gómez Acosta; Giovany Orozco Hernández; Daniel Fernando Quintero Bernal

doi:10.14482/inde.43.01.214.956

Authors

Luis Gabriel Gómez Acosta Universidad de Santiago de Chile (Chile) https://orcid.org/0000-0003-1667-5793
Giovany Orozco Hernández Universidad ECCI (Colombia) https://orcid.org/0000-0002-9132-7310
Daniel Fernando Quintero Bernal Universidad de Santiago de Chile (Chile) https://orcid.org/0000-0002-0745-6452

DOI:

https://doi.org/10.14482/inde.43.01.214.956

Keywords:

Chemical Characterization, Electronic Waste, Recyclability and Environmental Safety

Abstract

This study addresses the chemical and structural characterization of powders derived from the grinding of RAM memory waste, focusing on the identification of their chemical composition (metallic and non-metallic elements). Using advanced techniques such as X-ray energy dispersive spectroscopy (EDS) and X-ray diffraction, a variety of metallic (Cu, Si, Sn) and non-metallic (fiberglass) elements and compounds essential in the manufacture of electronic circuit boards were detected. Furthermore, the concentrations of environmentally hazardous elements (Pb, As, Cd) and polychlorinated biphenyls were evaluated, finding that, for the most part, they are within the levels permitted by international regulations, suggesting that these wastes are relatively safe from an ecological perspective. However, levels of lead exceeding the established limits were observed, indicating the need for careful management. This work contributes to the knowledge about the composition of electronic waste and underscores the importance of developing effective and safe recycling processes to mitigate potential environmental risks.

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